Sample Preparation for Translucent and Scanning Electron Microscopy: New Leica Microsystems Coaters

TitleSample Preparation for Translucent and Scanning Electron Microscopy: New Leica Microsystems Coaters
Publication TypeJournal Article
Year of Publication2014
AuthorsNiemova, SV
Short TitleSci. innov.
DOI10.15407/scine10.02.050
Volume10
Issue2
SectionThe World of Innovations
Pagination50-54
LanguageEnglish
Abstract

The research deals with new Leica Microsystems desktop coaters used for application of conductive layers in vacuum. Their technical specifications and scope of application have been described.

Keywordsautomatic control, electron microscopy, microstructure analysis, nanotechnology, replica, vacuum level